Author

Hoon Ryu received B.S. degree from Seoul National University, Korea, M.S. degree from Stanford University, and Ph.D. degree from Purdue University, USA. Dr. Ryu was with System LSI division in Samsung Electronics, and, is now a principal researcher at Korea Institute of Science and Technology Information, where he works nanoelectronics modeling for advanced materials and devices design with aids of numerical analysis. His research interests include modeling studies on properties of semiconductor materials and devices, and performance optimization of large-scale numerical problems in high performance computers.